This panel discussion will explore the critical link between module reliability and bankability in the context of advanced silicon PV technologies, specifically TOPCon and HJT. As these high efficiency modules enter the market at scale, concerns arise over the lack of technology specific reliability tests and the limitations of existing standards in predicting long-term field performance. The discussion will highlight the urgent need for stronger, harmonized qualification protocols to reduce financial risk, ensure investor confidence, and support the sustainable deployment of next generation PV.
